Bayes factors for edge detection from wavelet product spaces

Murtagh, F. and Starck, J.L.

(2003)

Murtagh, F. and Starck, J.L. (2003) Bayes factors for edge detection from wavelet product spaces. Optical Engineering, 42

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Abstract

Interband wavelet correlation provides one approach to defining edges in an image. Interband wavelet products follow long-tailed density distributions, and in such a context thresholding is very difficult. We show how segmentation using a Markov-field spatial dependence model is a more appropriate approach to demarcating edge and nonedge regions. A key part of this work is quantitative assessment of goodness of edge versus nonedge fit. We introduce a formal assessment framework based on Bayes factors. A detailed example is used to illustrate these results.

Information about this Version

This is a Submitted version
This version's date is: 5/2003
This item is not peer reviewed

Link to this Version

https://repository.royalholloway.ac.uk/items/cbd45e71-3e1e-dfb5-34fd-4b640276958b/2/

Item TypeJournal Article
TitleBayes factors for edge detection from wavelet product spaces
AuthorsMurtagh, F.
Starck, J.L.
Uncontrolled KeywordsInterband wavelet, Markov-field, Bayes factors
DepartmentsFaculty of Science\Computer Science

Identifiers

doihttp://dx.doi.org/10.1117/1.1564104

Deposited by Research Information System (atira) on 24-May-2012 in Royal Holloway Research Online.Last modified on 24-May-2012


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