Murtagh, F. and Starck, J.L. (2003) Bayes factors for edge detection from wavelet product spaces. Optical Engineering, 42
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Interband wavelet correlation provides one approach to defining edges in an image. Interband wavelet products follow long-tailed density distributions, and in such a context thresholding is very difficult. We show how segmentation using a Markov-field spatial dependence model is a more appropriate approach to demarcating edge and nonedge regions. A key part of this work is quantitative assessment of goodness of edge versus nonedge fit. We introduce a formal assessment framework based on Bayes factors. A detailed example is used to illustrate these results.
This is a Published version This version's date is: 05/2003 This item is not peer reviewed
https://repository.royalholloway.ac.uk/items/cbd45e71-3e1e-dfb5-34fd-4b640276958b/1/
Deposited by () on 23-Dec-2009 in Royal Holloway Research Online.Last modified on 23-Dec-2009